Model: JSM-IT500
Brand: JEOL
Configuration: equipped with Energy Dispersive X-ray Spectrometer (EDS), allows a resolution of 3 nm and Magnification power from 5 up to 300,000X
Highlight: SEM analysis is a powerful investigative tool that uses a focused beam of electrons to produce complex, high magnification images that can give information on a material’s surface chemical composition and topography.
Application: Due to its superior performance the SEM can provide valuable information
about a wide range of materials:
- Metals: steel, aluminum, titanium, copper, precious metals, alloys
- Ceramics: glass, concrete, alumina, zirconia, carbide, stone, porcelain
- Polymers: thermoplastics like PP, PE, Nylon
- Composites: carbon fiber, fiberglass, graphite, ceramic composites, resins
